atomic force microscope

英語（米国） (en-US) 英語（イギリス） (en-GB)

名詞

(physics) A device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface

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The atomic force microscope produced a detailed map of the graphene sheet by sensing minute forces between the tip and the surface.

詳細

意味（1）

(physics) A device used to map the atomic structure of a surface by measuring the force acting on the very fine tip of a wire moved over the surface

atomic force microscopes （ plural ）