Last Updated:2025/12/08
Sentence
研究者たちは、高分解能X線回折と原子間力顕微鏡を用いて薄膜のエピタキシャル層の品質(整合性、結晶性、平滑性)を評価した。
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The researchers evaluated the epitaxiality of the thin film using high-resolution X-ray diffraction and atomic force microscopy.
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The researchers evaluated the epitaxiality of the thin film using high-resolution X-ray diffraction and atomic force microscopy.
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epitaxiality
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