Last Updated:2025/11/19
Sentence

ストレス試験中の過熱により、回路内の電界効果トランジスタが故障した。

Quizzes for review

The FET in the circuit failed after overheating during the stress test.

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The FET in the circuit failed after overheating during the stress test.

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Related words

FET

Noun
abbreviation alt-of initialism
Japanese Meaning
電界効果トランジスタ
What is this buttons?

ストレス試験中の過熱により、回路内の電界効果トランジスタが故障した。

Related Words

plural

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