SHIM

abbreviation alt-of uncountable

(uncountable, microscopy) Abbreviation of scanning helium ion microscope.

Japanese Meaning

走査型ヘリウムイオン顕微鏡

SHIM provides high-resolution surface images of semiconductor devices that are difficult to resolve with conventional SEM.

走査ヘリウムイオン顕微鏡は、従来の走査型電子顕微鏡（SEM）では解像が難しい半導体デバイスの高解像度の表面画像を提供します。

Sense（1）

(uncountable, microscopy) Abbreviation of scanning helium ion microscope.