Last Updated：2025/12/02
The experiment measured the semiconductivities of various doped materials to determine their suitability for high-frequency devices.
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The experiment measured the semiconductivities of various doped materials to determine their suitability for high-frequency devices.
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その実験では、高周波デバイスへの適合性を判断するために、様々にドープされた半導体の導電率を測定した。
