Last Updated:2025/11/29

The research team measured the defect density in a-Si thin films after prolonged illumination.

See correct answer

The research team measured the defect density in a-Si thin films after prolonged illumination.

音声機能が動作しない場合はこちらをご確認ください
Edit Histories(0)
Source Sentence

研究チームは長時間の照射後にアモルファスシリコン薄膜の欠陥密度を測定した。

Sentence quizzes to help you learn to read

Edit Histories(0)

Login / Sign up

 

Download the app!
DiQt

DiQt

Free

★★★★★★★★★★