Last Updated:2025/11/28

During high-frequency testing, the parasitic element inside the amplifier caused unexpected signal attenuation and phase shift.

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During high-frequency testing, the parasitic element inside the amplifier caused unexpected signal attenuation and phase shift.

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高周波試験中、アンプ内部の寄生素子が予期せぬ信号減衰と位相シフトを引き起こした。

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